參數(shù)資料
型號(hào): AD5063BRMZ-1
廠商: Analog Devices Inc
文件頁數(shù): 4/20頁
文件大?。?/td> 0K
描述: IC DAC 16BIT 2.7-5.5V 10MSOP
標(biāo)準(zhǔn)包裝: 50
系列: nanoDAC™
設(shè)置時(shí)間: 1µs
位數(shù): 16
數(shù)據(jù)接口: 串行,SPI?
轉(zhuǎn)換器數(shù)目: 1
電壓電源: 單電源
工作溫度: -40°C ~ 85°C
安裝類型: 表面貼裝
封裝/外殼: 10-TFSOP,10-MSOP(0.118",3.00mm 寬)
供應(yīng)商設(shè)備封裝: 10-MSOP
包裝: 管件
輸出數(shù)目和類型: 1 電壓,單極;1 電壓,雙極
采樣率(每秒): 333k
產(chǎn)品目錄頁面: 781 (CN2011-ZH PDF)
AD5063
Rev. C | Page 12 of 2
0
TERMINOLOGY
Relative Accuracy
For the DAC, relative accuracy, or integral nonlinearity (INL), is
a measure of the maximum deviation, in LSB, from a straight
line passing through the endpoints of the DAC transfer
function. A typical INL error vs. code plot is shown in Figure 4.
Differential Nonlinearity (DNL)
Differential nonlinearity is the difference between the measured
change and the ideal 1 LSB change between any two adjacent
codes. A specified differential nonlinearity of ±1 LSB maximum
ensures monotonicity. This DAC is guaranteed monotonic by
design. A typical DNL error vs. code plot is shown in Figure 7.
Zero-Code Error
Zero-code error is a measure of the output error when zero
code (0x0000) is loaded to the DAC register. Ideally, the output
should be 0 V. The zero-code error is always positive in the
AD5063 because the output of the DAC cannot go below 0 V.
This is due to a combination of the offset errors in the DAC
and output amplifier. Zero-code error is expressed in mV.
Full-Scale Error
Full-scale error is a measure of the output error when full-scale
code (0xFFFF) is loaded to the DAC register. Ideally, the output
should be VDD 1 LSB. Full-scale error is expressed as a percentage
of the full-scale range.
Gain Error
Gain error is a measure of the span error of the DAC. It is the
deviation in slope of the DAC transfer characteristic from ideal,
expressed as a percentage of the full-scale range.
Total Unadjusted Error (TUE)
Total unadjusted error is a measure of the output error, taking
all the various errors into account. A typical TUE vs. code plot
is shown in Figure 5.
Zero-Code Error Drift
Zero-code error drift is a measure of the change in zero-code
error with a change in temperature. It is expressed in μV/°C.
Gain Error Drift
Gain error drift is a measure of the change in gain error with a
change in temperature. It is expressed in (ppm of full-scale
range)/°C.
Digital-to-Analog Glitch Impulse
Digital-to-analog glitch impulse is the impulse injected into the
analog output when the input code in the DAC register changes
state. It is normally specified as the area of the glitch in nV-s
and is measured when the digital input code is changed by
1 LSB at the major carry transition. See Figure 17 and Figure 21.
Figure 17 shows the glitch generated following completion of
the calibration routine; Figure 21 zooms in on this glitch.
Digital Feedthrough
Digital feedthrough is a measure of the impulse injected into
the analog output of the DAC from the digital inputs of the
DAC, but is measured when the DAC output is not updated. It
is specified in nV-s and measured with a full-scale code change
on the data bus, that is, from all 0s to all 1s, and vice versa.
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