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參數(shù)資料
型號: AD5062BRJZ-2500RL7
廠商: Analog Devices Inc
文件頁數(shù): 17/20頁
文件大小: 0K
描述: IC DAC 16BIT 2.7-5.5V SOT23-8
產(chǎn)品培訓(xùn)模塊: Data Converter Fundamentals
DAC Architectures
標(biāo)準(zhǔn)包裝: 1
系列: nanoDAC™
設(shè)置時間: 4µs
位數(shù): 16
數(shù)據(jù)接口: DSP,MICROWIRE?,QSPI?,串行,SPI?
轉(zhuǎn)換器數(shù)目: 1
電壓電源: 單電源
工作溫度: -40°C ~ 85°C
安裝類型: 表面貼裝
封裝/外殼: SOT-23-8
供應(yīng)商設(shè)備封裝: SOT-23-8
包裝: 標(biāo)準(zhǔn)包裝
輸出數(shù)目和類型: 1 電壓,單極;1 電壓,雙極
采樣率(每秒): 1.3M
其它名稱: AD5062BRJZ-2500RL7DKR
AD5062
Rev. A | Page 6 of 20
ABSOLUTE MAXIMUM RATINGS
Table 4.
Parameter
Rating
VDD to GND
0.3 V to +7.0 V
Digital Input Voltage to GND
0.3 V to VDD + 0.3 V
VOUT to GND
0.3 V to VDD + 0.3 V
VREF to GND
0.3 V to VDD + 0.3 V
Operating Temperature Range
Industrial (B grade)
40°C to +85°C
Storage Temperature Range
65°C to +150°C
Maximum Junction Temperature
150°C
SOT-23 Package
Power Dissipation
(TJ max TA)/θJA
θJA Thermal Impedance
206°C/W
θJc Thermal Impedance
44°C/W
Reflow Soldering (Pb-free)
Peak Temperature
260°C
Time-at-Peak Temperature
10 sec to 40 sec
ESD
1 kV
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only and functional operation of the device at these or
any other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
This device is a high performance integrated circuit with an
ESD rating of <2 kV, and is ESD-sensitive. Proper precautions
should be taken for handling and assembly.
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
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