參數(shù)資料
型號: A3362
廠商: Allegro MicroSystems, Inc.
英文描述: 2-Wire,Chopper-Stabilized, Hall Effect Switch(2線,斬波穩(wěn)定,霍爾效應(yīng)開關(guān))
中文描述: 2線,斬波穩(wěn)定,霍爾效應(yīng)開關(guān)(2線,斬波穩(wěn)定,霍爾效應(yīng)開關(guān))
文件頁數(shù): 6/12頁
文件大?。?/td> 170K
代理商: A3362
3361
AND
3362
2-WIRE,
CHOPPER-STABILIZED,
HALL-EFFECT SWITCHES
115 Northeast Cutoff, Box 15036
Worcester, Massachusetts 01615-0036 (508) 853-5000
6
All Allegro sensors are subjected to stringent qualification requirements prior to being released to production.
To become qualified, except for the destructive ESD tests, no failures are permitted.
CRITERIA FOR DEVICE QUALIFICATION
Qualification Test
Test Method and Test Conditions
Test Length
Samples
Comments
Biased Humidity (HAST)
T
A
= 130
°
C, RH = 85%
50 hrs
77
V
CC
= V
OUT
= 5 V
High-Temperature
Operating Life (HTOL)
JESD22-A108,
T
A
= 150
°
C, T
J
= 165
°
C
408 hrs
77
V
CC
= 24 V,
V
OUT
= 20 V
Accelerated HTOL
JESD22-A108,
T
A
= 175
°
C, T
J
= 190
°
C
504 hrs
77
V
CC
= 24 V,
V
OUT
= 20 V
Autoclave, Unbiased
JESD22-A102, Condition C,
T
A
= 121
°
C, 15 psig
96 hrs
77
High-Temperature
(Bake) Storage Life
MIL-STD-883, Method 1008,
T
A
= 170
°
C
1000 hrs
77
Temperature Cycle
MIL-STD-883, Method 1010,
-65
°
C to +150
°
C
500 cycles
77
Latch-Up
Pre/Post
Reading
6
Electro-Thermally
Induced Gate Leakage
Pre/Post
Reading
6
ESD,
Human Body Model
CDF-AEC-Q100-002
Pre/Post
Reading
x per
test
Test to failure,
All leads > TBD
Electrical Distributions
Per Specification
30
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