參數(shù)資料
型號: 9S12C128DGV1
英文描述: MC9S12C Family Device User Guide
中文描述: MC9S12C家庭設備用戶指南
文件頁數(shù): 107/136頁
文件大小: 2190K
代理商: 9S12C128DGV1
107
B.5.2 NVM Reliability
The reliability of the NVM blocks is guaranteed by stress test during qualification, constant process
monitors and burn-in to screen early life failures.
The program/erase cycle count on the sector is incremented every time a sector or mass erase event is
executed.
NOTE:
All values shown in Table B-9 are target values and subject to further extensive
characterization.
Table B-9 NVM Reliability Characteristics
Conditions are shown in Table A-4 unless otherwise noted
Num
C
Rating
Symbol
Min
Typ
Max
Unit
1
1
NOTES
:
1. Data Retention at maximum guaranteed device operating temperature up to 1 year
C
Data Retention at an average junction temperature of
T
Javg
= 85
°
C
t
NVMRET
15
Years
2
C
Flash number of Program/Erase cycles
n
FLPE
10,000
Cycles
F
Freescale Semiconductor, Inc.
For More Information On This Product,
Go to: www.freescale.com
n
.
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