參數(shù)資料
型號: 933812570602
廠商: NXP SEMICONDUCTORS
元件分類: 編、解碼器及復(fù)用、解復(fù)用
英文描述: F/FAST SERIES, QUAD 2 LINE TO 1 LINE MULTIPLEXER, TRUE OUTPUT, PDSO16
封裝: 3.90 MM, PLASTIC, MS-012AC, SOT-109-1, SO-16
文件頁數(shù): 5/10頁
文件大?。?/td> 84K
代理商: 933812570602
Philips Semiconductors
Product specification
74F157A, 74F158A
Data selectors/multiplexers
2000 Jun 30
4
ABSOLUTE MAXIMUM RATINGS
(Operation beyond the limit set forth in this table may impair the useful life of the device.
Unless otherwise noted these limits are over the operating free-air temperature range.)
SYMBOL
PARAMETER
RATING
UNIT
VCC
Supply voltage
–0.5 to +7.0
V
VIN
Input voltage
–0.5 to +7.0
V
IIN
Input current
–30 to +5
mA
VOUT
Voltage applied to output in High output state
–0.5 to VCC
V
IOUT
Current applied to output in Low output state
40
mA
T
b
Operating free-air temperature range
Commercial Range
0 to +70
°C
Tamb
O erating free-air tem erature range
Industrial Range 74F157A only
–40 to +85
°C
Tstg
Storage temperature range
–65 to +150
°C
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
LIMITS
UNIT
SYMBOL
PARAMETER
MIN
NOM
MAX
UNIT
VCC
Supply voltage
4.5
5.0
5.5
V
VIH
High-level input voltage
2.0
V
VIL
Low-level input voltage
0.8
V
IIK
Input clamp current
–18
mA
IOH
High-level output current
–1
mA
IOL
Low-level output current
20
mA
T
Operating free air temperature range
Commercial Range
0
70
Tamb
Operating free air temperature range
Industrial Range 74F157A only
–40
85
°C
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS1
LIMITS
UNIT
SYMBOL
PARAMETER
TEST CONDITIONS1
MIN
TYP2
MAX
UNIT
VOH
High-level output voltage
VCC = MIN, VIL = MAX
±10%VCC
2.5
V
VOH
High-level out ut voltage
VIH = MIN, IOH = MAX
±5%VCC
2.7
3.4
V
VOL
Low-level output voltage
VCC = MIN, VIL = MAX
±10%VCC
0.30
0.50
V
VOL
Low-level out ut voltage
VIH = MIN, IOL = MAX
±5%VCC
0.30
0.50
V
VIK
Input clamp voltage
VCC = MIN, II = IIK
–0.73
–1.2
V
II
Input current at maximum input voltage
VCC = MAX, VI = 7.0V
100
A
IIH
High-level input current
VCC = MAX, VI = 2.7V
20
A
IIL
Low-level input current
VCC = MAX, VI = 0.5V
–0.6
mA
IOS
Short-circuit output current3
VCC = MAX
–60
–150
mA
ICC
Supply current (total)4
74F157A
VCC = MAX
15.0
23.0
mA
ICC
Su
ly current (total)4
74F158A
VCC = MAX
14.0
19.0
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at VCC = 5V, Tamb = 25°C.
3. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, IOS tests should be performed last.
4. ICC is measured with 4.5V applied to all inputs and all outputs open.
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