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參數(shù)資料
| 型號： | 74FCT2574CTSOCTG4 |
| 廠商： | Conexant Systems, Inc. |
| 英文描述： | 8-BIT REGISTER WITH 3-STATE OUTPUTS |
| 中文描述： | 8位寄存器具有三態(tài)輸出 |
| 文件頁數(shù)： | 4/15頁 |
| 文件大?。?/td> | 322K |
| 代理商： | 74FCT2574CTSOCTG4 |
CY74FCT2374T
8-BIT REGISTER
WITH 3-STATE OUTPUTS
SCCS040A
–
SEPTEMBER 1994
–
REVISED OCTOBER 2001
4
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
VIK
VOH
VOL
ROUT
Vhys
II
IIH
IIL
IOZH
IOZL
IOS
Ioff
ICC
ICC
VCC = 4.75 V,
VCC = 4.75 V,
VCC = 4.75 V,
VCC = 4.75 V,
All inputs
IIN =
–
18 mA
IOH =
–
15 mA
IOL = 12 mA
IOL = 12 mA
–
0.7
–
1.2
V
2.4
3.3
V
0.3
0.55
V
V
μ
A
μ
A
μ
A
μ
A
μ
A
mA
μ
A
20
25
40
0.2
VCC = 5.25 V,
VCC = 5.25 V,
VCC = 5.25 V,
VCC = 5.25 V,
VCC = 5.25 V,
VCC = 5.25 V,
VCC = 0 V,
VCC = 5.25 V,
VCC = 5.25 V, VIN = 3.4 V
§
, f1 = 0, Outputs open
VCC = 5.25 V, Outputs open, One input switching at 50% duty cycle,
OE = GND, VIN
≤
0.2 V or VIN
≥
VCC
–
0.2 V
VIN = VCC
VIN = 2.7 V
VIN = 0.5 V
VOUT = 2.7 V
VOUT = 0.5 V
VOUT = 0 V
VOUT = 4.5 V
VIN
≤
0.2 V,
5
±
1
±
1
10
–
10
–
60
–
120
–
225
±
1
VIN
≥
VCC
–
0.2 V
0.1
0.2
mA
0.5
2
mA
ICCD
0.06
0.12
mA/
MHz
VCC= 5 25 V
Outputs open,
f0 = 10 MHz,
OE = GND
One bit switching
at f1 = 5 MHz
at 50% duty cycle
VIN
≤
0.2 V or
VIN
≥
VCC
–
0.2V
VIN = 3.4 V or GND
VIN
≤
0.2 V or
VIN
≥
VCC
–
0.2 V
VIN = 3.4 V or GND
0.7
1.4
1.2
3.4
mA
IC#
Eight bits switching
at f1 = 2.5 MHz
at 50% duty cycle
1.6
3.2||
3.9
12.2||
Ci
Co
5
10
pF
9
12
pF
Typical values are at VCC = 5 V, TA = 25
°
C.
Not more than one output should be shorted at a time. Duration of short should not exceed one second. The use of high-speed test apparatus
and/or sample-and-hold techniques are preferable to minimize internal chip heating and more accurately reflect operational values. Otherwise,
prolonged shorting of a high output can raise the chip temperature well above normal and cause invalid readings in other parametric tests. In
any sequence of parameter tests, IOS tests should be performed last.
§
Per TTL-driven input (VIN = 3.4 V); all other inputs at VCC or GND
This parameter is derived for use in total power-supply calculations.
#IC
= ICC +
ICC
×
DH
×
NT + ICCD (f0/2 + f1
×
N1)
Where:
IC
= Total supply current
ICC
= Power-supply current with CMOS input levels
ICC= Power-supply current for a TTL high input (VIN = 3.4 V)
DH
= Duty cycle for TTL inputs high
NT
= Number of TTL inputs at DH
ICCD= Dynamic current caused by an input transition pair (HLH or LHL)
f0
= Clock frequency for registered devices, otherwise zero
f1
= Input signal frequency
N1
= Number of inputs changing at f1
All currents are in milliamperes and all frequencies are in megahertz.
||Values for these conditions are examples of the ICC formula.
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