參數(shù)資料
型號: 74F544SC
廠商: NATIONAL SEMICONDUCTOR CORP
元件分類: 通用總線功能
英文描述: Octal Registered Transceiver
中文描述: F/FAST SERIES, 8-BIT REGISTERED TRANSCEIVER, INVERTED OUTPUT, PDSO24
封裝: 0.300 INCH, PLASTIC, SOIC-24
文件頁數(shù): 7/16頁
文件大小: 119K
代理商: 74F544SC
Philips Semiconductors
Product specification
74F543, 74F544
Octal registered transceivers
1994 Dec 5
7
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS
1
LIMITS
UNIT
MIN
TYP
2
MAX
A0 - A7,
A0 - A7
V
CC
= MIN
V
IL
= MAX
IH
= MIN
V
MIN
I
OH
= -3mA
10%V
CC
5%V
CC
10%V
CC
5%V
CC
10%V
CC
5%V
CC
10%V
CC
5%V
CC
2.4
V
V
OH
High-level output voltage
High-level out ut voltage
2.7
3.4
V
B0 - B7,
B0 - B7
I
OH
= -15mA
2.0
V
2.0
V
A0 - A7,
A0 - A7
V
CC
= MIN
V
IL
= MAX
= MIN
V
IH
MIN
I
OL
= 24mA
0.35
0.50
V
V
OL
Low-level output voltage
Low-level out ut voltage
0.35
0.50
V
B0 - B7,
B0 - B7
I
OL
= 64mA
0.55
V
0.42
0.55
V
V
IK
Input clamp voltage
V
CC
= MIN, I
I
= I
IK
V
CC
= MAX, V
I
= 7.0 V
V
CC
= 5.5, V
I
= 5.5V
V
CC
= MAX, V
I
= 2.7V
–0.73
–1.2
V
I
I
Input current at maximum
input voltage
OEAB, OEBA, EAB
100
μ
A
Others
1
mA
I
IH
High-level input current
20
μ
A
Others
–0.6
mA
I
IL
Low-level input current
EAB,
EBA
V
CC
= MAX, V
I
= 0.5V
–1.2
mA
I
OZH
+ I
IH
I
OZH
+ I
IL
Off-state output current, high-level voltage applied
V
CC
= MAX, V
O
= 2.7V
V
CC
= MAX, V
O
= 0. 5V
70
μ
A
Off-state output current, Low-level voltage applied
–600
μ
A
I
OS
Short-circuit output current
Short-circuit out ut current
3
A0 - A7,
A0 - A7
V
CC
= MAX
–60
–150
mA
B0 - B7,
B0 - B7
–100
–225
mA
I
CCH
I
CCL
I
CCZ
I
CCH
I
CCL
I
CCZ
70
105
mA
74F543
V
CC
= MAX
95
135
mA
I
CC
Supply current (total)
95
135
mA
80
110
mA
74F544
V
CC
= MAX
105
140
mA
100
135
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under the recommended operating conditions for the applicable
type.
2. All typical values are at V
= 5V, T
= 25
°
C.
3. Not more than one output should be shorted at a time. For testing I
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OS
tests should be performed last.
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