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參數(shù)資料
| 型號(hào)： | 74F1779 |
| 廠商： | NXP Semiconductors N.V. |
| 元件分類： | 通用總線功能 |
| 英文描述： | 8-bit bidirectional binary counter -State |
| 中文描述： | 8位雙向二進(jìn)制計(jì)數(shù)器國(guó)家 |
| 文件頁(yè)數(shù)： | 6/12頁(yè) |
| 文件大?。?/td> | 110K |
| 代理商： | 74F1779 |
Philips Semiconductors
Product specification
74F1779
8-bit bidirectional binary counter (3-State)
1989 Apr 06
6
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS
1
LIMITS
UNIT
MIN
TYP
2
MAX
TC
V
CC
= MIN,
V
IL
= MAX
V
IH
= MIN
= 1mA
I
OH
= –1mA
±
10%V
CC
2.5
V
V
OH
High level output voltage
High-level output voltage
±
5%V
CC
2.7
3.4
V
I/On
V
CC
= MIN,
V
IL
= MAX
V
IH
= MIN
= 3mA
I
OH
= –3mA
±
10%V
CC
2.4
V
±
5%V
CC
2.7
3.3
V
V
OL
Low level output voltage
Low-level output voltage
V
CC
= MIN,
V
IL
= MAX
V
IH
= MIN
I
OL
= MAX
±
10%V
CC
0.30
0.50
V
±
5%V
CC
0.35
0.50
V
V
IK
Input clamp voltage
V
CC
= MIN, I
I
= I
IK
V
CC
= 5.5V, V
I
= 5.5V
V
CC
= 5.5V, V
I
= 7.0V
V
CC
= MAX, V
I
= 2.7V
V
CC
= MAX, V
I
= 0.5V
–0.73
–1.2
V
I
I
Input current at maximum
input voltage
I/On
1
mA
others
100
μ
A
μ
A
I
IH
I
IL
High-level input current
except
I/On
20
Low-level input current
–0.6
mA
I
IH
+I
OZH
Off-state output current
High-level voltage applied
I/On
V
CC
= MAX, V
O
= 2.7V
70
μ
A
I
IL
+I
OZL
Off-state output current
Low-level voltage applied
Short-circuit output current
3
V
CC
= MAX, V
O
= 0.5V
–600
μ
A
I
OS
V
CC
= MAX
–60
–150
mA
I
CCH
I
CCL
I
CCZ
100
145
mA
I
CC
Supply current (total)
V
CC
= MAX
100
145
mA
110
155
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
= 5V. T
= 25
°
C.
3. Not more than one output should be shorted at a time. For testing I
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other tests. In any sequence of
parameter tests, I
OS
tests should be performed last.
AC ELECTRICAL CHARACTERISTICS
LIMITS
SYMBOL
PARAMETER
TEST
CONDITION
T
amb
= +25
°
C
V
= +5.0V
C
L
= 50pF, R
L
= 500
T
amb
= 0
°
C to +70
°
C
V
= +5.0V
±
10%
C
L
= 50pF, R
L
= 500
UNIT
MIN
TYP
MAX
MIN
MAX
f
MAX
t
PLH
t
PHL
t
PLH
t
PHL
t
PLH
t
PHL
t
PZH
t
PZL
t
PHZ
t
PLZ
Maximum clock frequency
Waveform 1
115
130
100
MHz
Propagation delay
CP to I/On
Waveform 1
4.0
5.0
6.5
7.0
10.0
10.5
4.0
5.0
10.5
11.0
ns
Propagation delay
CP to TC
Waveform 1
4.0
4.5
6.5
6.5
9.0
9.0
3.5
4.0
9.5
9.5
ns
Propagation delay
CET to TC
Waveform 2
2.0
2.5
4.0
4.5
6.5
7.0
2.0
2.5
7.5
7.5
ns
Output Enable time to
High or Low level
Waveform 4
Waveform 5
2.0
4.5
4.0
6.5
6.5
9.0
2.0
4.0
7.5
9.5
ns
Output Enable time from
High or Low level
Waveform 4
Waveform 5
1.0
1.0
3.0
4.0
6.0
7.0
1.0
1.0
6.5
7.5
ns
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