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參數(shù)資料
| 型號(hào)： | 74F161A |
| 廠商： | NXP Semiconductors N.V. |
| 元件分類： | 通用總線功能 |
| 英文描述： | 4-bit binary counters(4位二進(jìn)制計(jì)數(shù)器) |
| 中文描述： | 4位二進(jìn)制計(jì)數(shù)器（4位二進(jìn)制計(jì)數(shù)器） |
| 文件頁數(shù)： | 7/14頁 |
| 文件大小： | 111K |
| 代理商： | 74F161A |
Philips Semiconductors
Product specification
74F161A, 74F163A
4-bit binary counters
1996 Jan 29
7
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
LIMITS
UNIT
MIN
NOM
MAX
V
CC
V
IH
V
IL
I
IK
I
OH
I
OL
Supply voltage
4.5
5.0
5.5
V
High-level input voltage
2.0
V
Low-level input voltage
0.8
V
Input clamp current
–18
mA
High-level output current
–1
mA
Low-level output current
20
mA
T
amb
Operating free air temperature range
Operating free-air temperature range
Commercial range
0
+70
°
C
°
C
Industrial range
–40
+85
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS
1
LIMITS
UNIT
MIN
TYP
2
MAX
V
OH
High level output voltage
High-level output voltage
V
= MIN, V
= MAX,
CC
V
IH
= MIN
= MAX
I
OH
±
10%V
CC
±
5%V
CC
±
10%V
CC
±
5%V
CC
2.5
V
IL
2.7
3.4
V
V
OL
Low level output voltage
Low-level output voltage
V
= MIN, V
= MAX,
CC
V
IH
= MIN
= MAX
I
OL
0.30
0.50
V
IL
0.30
0.50
V
V
IK
I
I
I
IH
Input clamp voltage
V
CC
= MIN, I
I
= I
IK
V
CC
= MAX, V
I
= 7.0V
V
CC
= MAX, V
I
= 2.7V
–0.73
–1.2
V
Input current at maximum input voltage
100
μ
A
μ
A
High-level input current
20
I
IL
Low level input current
Low-level input current
CET, PE
V
CC
= MAX V = 0 5V
I
= 0.5V
–1.2
mA
others
–0.6
mA
I
OS
Short-circuit output current
3
V
CC
= MAX
-60
–150
mA
I
CC
Supply current (total)
I
CCH
I
CCL
V
CC
= MAX
42
55
mA
49
65
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
CC
= 5V, T
amb
= 25
°
C.
3. Not more than one output should be shorted at a time. For testing I
OS
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OS
tests should be performed last.
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