參數(shù)資料
型號(hào): 74ABT2541
廠商: Fairchild Semiconductor Corporation
英文描述: Octal Buffer/Line Driver with 25Ω Series Resistors in the Outputs(八緩沖器/線驅(qū)動(dòng)器(三態(tài)輸出))
中文描述: 八路緩沖器/線與25Ω串聯(lián)電阻的輸出(八緩沖器/線驅(qū)動(dòng)器(三態(tài)輸出)驅(qū)動(dòng)程序)
文件頁(yè)數(shù): 2/9頁(yè)
文件大小: 100K
代理商: 74ABT2541
www.fairchildsemi.com
2
7
Absolute Maximum Ratings
(Note 1)
Recommended Operating
Conditions
Note 1:
Absolute maximum ratings are values beyond which the device
may be damaged or have its useful life impaired. Functional operation
under these conditions is not implied.
Note 2:
Either voltage limit or current limit is sufficient to protect inputs.
DC Electrical Characteristics
Note 3:
Guaranteed, but not tested.
Note 4:
For 8 bit toggling, I
CCD
<
0.8 mA/MHz.
Storage Temperature
Ambient Temperature under Bias
Junction Temperature under Bias
V
CC
Pin Potential to Ground Pin
Input Voltage (Note 2)
Input Current (Note 2)
Voltage Applied to Any Output
in the Disabled or
Power-Off State
in the HIGH State
Current Applied to Output
in LOW State (Max)
DC Latchup Source Current
Over Voltage Latchup (I/O)
65
°
C to
+
150
°
C
55
°
C to
+
125
°
C
55
°
C to
+
150
°
C
0.5V to
+
7.0V
0.5V to
+
7.0V
30 mA to
+
5.0 mA
0.5V to 5.5V
0.5V to V
CC
twice the rated I
OL
(mA)
500 mA
10V
Free Air Ambient Temperature
Supply Voltage
Minimum Input Edge Rate (
V/
t)
Data Input
Enable Input
40
°
C to
+
85
°
C
+
4.5V to
+
5.5V
50 mV/ns
20 mV/ns
Symbol
Parameter
Min
Typ
Max
Units
V
CC
Conditions
V
IH
V
IL
V
CD
V
OH
Input HIGH Voltage
Input LOW Voltage
Input Clamp Diode Voltage
2.0
V
V
V
Recognized HIGH Signal
Recognized LOW Signal
I
IN
=
18 mA
I
OH
=
3 mA
I
OH
=
32 mA
I
OL
=
15 mA
V
IN
=
2.7V (Note 3)
V
IN
=
V
CC
0.8
1.2
Min
Output HIGH Voltage
2.5
2.0
V
V
V
μ
A
Min
Min
Min
V
OL
I
IH
Output LOW Voltage
0.8
Input HIGH Current
1
1
Max
I
BVI
Input HIGH Current
7
μ
A
Max
V
IN
=
7.0V
Breakdown Test
Input LOW Current
I
IL
1
1
μ
A
Max
V
IN
=
0.5V (Note 3)
V
IN
=
0.0V
I
ID
=
1.9
μ
A
All Other Pins Grounded
V
ID
Input Leakage Test
4.75
V
0.0
I
OZH
Output Leakage Current
10
μ
A
0
5.5V
V
OUT
=
2.7V; OE
n
=
2.0V
I
OZL
I
OS
I
CEX
I
ZZ
I
CCH
I
CCL
I
CCZ
Output Leakage Current
10
μ
A
0
5.5V
V
OUT
=
0.5V; OE
n
=
2.0V
V
OUT
=
0.0V
V
OUT
=
V
CC
V
OUT
=
5.5V; All Others GND
All Outputs HIGH
Output Short-Circuit Current
100
275
50
100
50
mA
μ
A
μ
A
μ
A
mA
Max
Output High Leakage Current
Bus Drainage Test
Power Supply Current
Max
0.0
Max
Power Supply Current
30
Max
All Outputs LOW
Power Supply Current
50
μ
A
Max
OE
n
=
V
CC
;
All Others at V
CC
or GND
V
I
=
V
CC
2.1V
Enable Input V
I
=
V
CC
2.1V
Data Input V
I
=
V
CC
2.1V
All Others at V
CC
or GND
Outputs OPEN
I
CCT
Additional I
CC
/Input
Outputs Enabled
2.5
mA
Outputs 3-STATE
Outputs 3-STATE
2.5
50
mA
μ
A
Max
I
CCD
Dynamic I
CC
(Note 4)
No Load
mA/
Max
0.1
MHz
OE
n
=
GND
One Bit Toggling, 50% Duty Cycle
(Note 3)
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