參數(shù)資料
型號(hào)： 5962F9563601VCC
英文描述： Quad 2-input NAND Gate
中文描述： 四2輸入與非門
文件頁(yè)數(shù)： 32/41頁(yè)
文件大?。?/td> 290K
代理商： 5962F9563601VCC
SIZE
A
5962-94663
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
REVISION LEVEL
B
SHEET
32
DSCC FORM 2234
APR 97
TABLE IIA. Electrical test requirements.
Test requirements
Subgroups
(in accordance with
MIL-STD-883,
method 5005, table I)
Subgroups
(in accordance with
MIL-PRF-38535, table III)
Device
class M
Device
class Q
Device
class V
Interim electrical
parameters (see 4.2)
---
---
---
Final electrical
parameters (see 4.2)
1, 2, 3, 7, 8, 9,
10, 11 1/
1, 2, 3, 7, 8, 9,
10, 11 1/
1, 2, 3, 7, 8, 9,
10, 11 2/ 3/
Group A test
requirements (see 4.4)
1, 2, 3, 4, 7, 8, 9,
10, 11
1, 2, 3, 4, 7, 8, 9,
10, 11
1, 2, 3, 4, 7, 8, 9,
10, 11
Group C end-point electrical
parameters (see 4.4)
1, 7, 9
1, 7, 9
1, 7, 9
Group D end-point electrical
parameters (see 4.4)
1, 7, 9
1, 7, 9
1, 7, 9
Group E end-point electrical
parameters (see 4.4)
1, 7, 9
1, 7, 9
1, 7, 9
1/ PDA applies to subgroup 1.
2/ PDA applies to subgroups 1 and 7.
3/ Delta limits, as specified in table IIB herein, shall be required when specified and the delta values shall be
completed with reference to the zero hour electrical parameters.
TABLE IIB. Burn-in and operating life test, delta parameters (+25
°
C).
Parameter
Symbol
Delta limits
Quiescent current
I
DDQ
±
10% of measured values or
35
μ
A whichever is greater
NOTE: If the device is tested at or below 35
μ
A, no deltas are required.
4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table IIA herein.
4.4.2.1 Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883:
a.
Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify
the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test
method 1005 of MIL-STD-883.
b.
T
A
= +125
°
C, minimum.
c.
Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
相關(guān)PDF資料
PDF描述
5962F9563601VXC Low-Power, Serial, 12-Bit DACs with Voltage-Output
5962F9563602VCC Quad 2-input NAND Gate
5962F9563602VXC Low-Power, Serial, 12-Bit DACs with Force-Sense Voltage-Output
5962F9565001VCC Quad 2-input NAND Gate
5962F9565001VXC Low-Power, Serial, 12-Bit DACs with Force-Sense Voltage-Output
相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
5962F9568901QXC 制造商:Intersil Corporation 功能描述:
5962F9568901VXC 制造商:Intersil Corporation 功能描述:
5962F9568902QXC 制造商:Intersil Corporation 功能描述:
5962F9568902VXC 制造商:Intersil Corporation 功能描述:
5962F9666301QXC 制造商:Intersil Corporation 功能描述:
發(fā)布緊急采購(gòu)，3分鐘左右您將得到回復(fù)。

采購(gòu)需求

(若只采購(gòu)一條型號(hào)，填寫一行即可)

發(fā)布成功！您可以繼續(xù)發(fā)布采購(gòu)。也可以進(jìn)入我的后臺(tái)，查看報(bào)價(jià)

發(fā)布成功！您可以繼續(xù)發(fā)布采購(gòu)。也可以進(jìn)入我的后臺(tái)，查看報(bào)價(jià)

*型號(hào) *數(shù)量 廠商 批號(hào) 封裝
添加更多采購(gòu)

我的聯(lián)系方式

*
*
*