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參數(shù)資料
| 型號(hào)： | 5962-9761002HXA |
| 英文描述： | Voltage-Output, 12-Bit Multiplying DACs |
| 中文描述： | EEPROM的 |
| 文件頁數(shù)： | 17/19頁 |
| 文件大?。?/td> | 84K |
| 代理商： | 5962-9761002HXA |
STANDARD
MICROCIRCUIT DRAWING
SIZE
A
5962-97610
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
REVISION LEVEL
SHEET
17
DSCC FORM 2234
APR 97
TABLE II. Electrical test requirements.
MIL-PRF-38534 test requirements
Subgroups
(in accordance with
MIL-PRF-38534, group A test
table)
Interim electrical parameters
1,4,7,9
Final electrical parameters
1*, 2,3,4,7,8A,8B,9,10,11
Group A test requirements
1,2,3,4,7,8A,8B,9,10,11
Group C end-point electrical
parameters
1,2,3,4,7,8A,8B,9,10,11
End-point electrical parameters
for Radiation Hardness Assurance
(RHA) devices
Not applicable
* PDA applies to subgroup 1.
4. QUALITY ASSURANCE PROVISIONS
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as
modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the
form, fit, or function as described herein.
4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply:
a.Burn-in test, method 1015 of MIL-STD-883.
(1)
Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision
level control and shall be made available to either DSCC-VA or the acquiring activity upon request. Also, the test
circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent
specified in test method 1015 of MIL-STD-883.
T
A
as specified in accordance with table I of method 1015 of MIL-STD-883.
(2)
b.Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter
tests prior to burn-in are optional at the discretion of the manufacturer.
4.3 Conformance and periodic inspections. Conformance inspection (CI) and periodic inspection (PI) shall be in
accordance with MIL-PRF-38534 and as specified herein.
4.3.1 Group A inspection (CI). Group A inspection shall be in accordance with MIL-PRF-38534 and as follows:
a.Tests shall be as specified in table II herein.
b.Subgroups 5 and 6 shall be omitted.
c.Subgroups 7 and 8 shall include verification of the truth table on figure 3.
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| 5962-9761002HXC | 制造商:Microsemi Corporation 功能描述:2M X 16 FLASH DUALITHIC, 5V, 120NS, 56 CSOP, SMD - Bulk |
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| 5962-9761501Q2A | 制造商:Texas Instruments 功能描述:Inverter Schmitt Trigger 6-Element CMOS 20-Pin LCCC Tube 制造商:Texas Instruments 功能描述:INVERTER SCHMITT TRIGGER 6-ELEM CMOS 20LCCC - Rail/Tube |
| 5962-9761501QCA | 制造商:Texas Instruments 功能描述:Inverter Schmitt Trigger 6-Element CMOS 14-Pin CDIP Tube 制造商:Texas Instruments 功能描述:INVERTER SCHMITT TRIGGER 6-ELEM CMOS 14CDIP - Rail/Tube |
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