參數(shù)資料
型號(hào): 5962-9080801MHA
廠商: TEXAS INSTRUMENTS INC
元件分類(lèi): 運(yùn)算放大器
英文描述: DUAL OP-AMP, 7000 uV OFFSET-MAX, 1.3 MHz BAND WIDTH, CDFP10
封裝: CERAMIC, DFP-10
文件頁(yè)數(shù): 40/81頁(yè)
文件大小: 1788K
代理商: 5962-9080801MHA
TLE206x, TLE206xA, TLE206xB
EXCALIBUR JFET INPUT HIGHOUTPUT DRIVE
POWER OPERATIONAL AMPLIFIERS
SLOS193B FEBRUARY 1997 REVISED MAY 2004
45
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
PARAMETER MEASUREMENT INFORMATION
Figure 1. Slew-Rate Test Circuit
RL
(see Note A)
CL
VO
VCC
VI
+
VCC +
NOTE A: CL includes fixture capacitance.
Figure 2. Noise-Voltage Test Circuit
VO
RS
2 k
VCC
VCC +
+
VO
RL
CL
(see Note A)
10 k
100
VI
VCC
VCC +
+
NOTE A: CL includes fixture capacitance.
Figure 3. Unity-Gain Bandwidth and Phase-Margin Test Circuit
typical values
Typical values presented in this data sheet represent the median (50% point) of device parametric performance.
input bias and offset current
At the picoampere bias current level typical of the TLE206x, TLE2064xA, and TLE206xB, accurate
measurement of the bias current becomes difficult. Not only does this measurement require a picoammeter,
but test socket leakages can easily exceed the actual device bias currents. To accurately measure these small
currents, Texas Instruments uses a two-step process. The socket leakage is measured using picoammeters
with bias voltages applied but with no device in the socket. The device is then inserted into the socket and a
second test that measures both the socket leakage and the device input bias current is performed. The two
measurements are then subtracted algebraically to determine the bias current of the device.
相關(guān)PDF資料
PDF描述
5962-9080802QHA DUAL OP-AMP, 6000 uV OFFSET-MAX, 1.3 MHz BAND WIDTH, CDFP10
5962-9080803QPA DUAL OP-AMP, 5000 uV OFFSET-MAX, 1.3 MHz BAND WIDTH, CDIP8
5962-9081801M2X OP-AMP, 20000 uV OFFSET-MAX, CQCC20
5962-9081801M2A OP-AMP, 30000 uV OFFSET-MAX, CQCC20
5962-9081801MCX OP-AMP, 20000 uV OFFSET-MAX, CDIP14
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