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7
Parameter
Symbol
Typ.
Units
Conditions
Fig.
Note
I
HYS
1.2
mA
I
HYS
= I
TH+
- I
TH-
Hysteresis
1
V
HYS
1.1
V
V
HYS
= V
TH+
- V
TH-
Input Clamp Voltage
V
ILC
-0.76
V
V
ILC
= V
2
- V
3
; V
3
= GND;
I
IN
= -10 mA
Bridge Diode
Forward Voltage
V
D1,2
0.62
I
IN
= 3 mA (see schematic)
V
D3,4
R
I-O
0.73
Input-Output Resistance
10
12
V
I-O
= 500 Vdc
9
Input-Output Capacitance
C
I-O
2.0
pF
f = 1 MHz, V
I-O
= 0 Vdc
Input Capacitance
C
IN
50
pF
f = 1 MHz; V
IN
= 0 V,
Pins 2 & 3, Pins 1 & 4 Open
Output Rise Time
(10-90%)
t
r
10
μ
s
7
Output Fall Time
(90-10%)
t
f
0.5
μ
s
7
Typical Characteristics
All typical values are at T
A
= 25
°
C, V
CC
= 5 V, unless otherwise specified.
Notes:
1. Maximum operating frequency is
defined when output waveform (Pin 6)
attains only 90% of V
CC
with R
L
= 1.8
k
, C
L
= 15 pF using a 5 V square
wave input signal.
2. Measured at a point 1.6 mm below
seating plane.
3. Current into/out of any single lead.
4. Surge input current duration is 3 ms at
120 Hz pulse repetition rate. Transient
input current duration is 10
μ
s at
120 Hz pulse repetition rate. Note that
maximum input power, P
IN
, must be
observed.
5. Derate linearly above 100
°
C free-air
temperature at a rate of 4.26 mW/
°
C.
Maximum input power dissipation of
195 mW allows an input IC junction
temperature of 150
°
C at an ambient
temperature of T
A
= 125
°
C with a
typical thermal resistance from
junction to ambient of
θ
JA
= 235
°
C/W.
The typical thermal resistance from
junction to case is equal to 170
°
C/W.
Excessive P
IN
and T
J
may result in
device degradation.
6. The 1.8 k
load represents 1 TTL unit
load of 1.6 mA and the 4.7 k
pull-up
resistor.
7. Logic low output level at Pin 6 occurs
under the conditions of V
IN
≥
V
TH+
as
well as the range of V
IN
> V
TH
– once
V
IN
has exceeded V
TH+
. Logic high
output level at Pin 6 occurs under the
conditions of V
IN
≤
V
TH-
as well as the
range of V
IN
< V
TH+
once V
IN
has
decreased below V
TH-
.
8. The ac voltage is instantaneous
voltage.
9. Device considered a two terminal
device: Pins 1, 2, 3, 4 connected
together, Pins 5, 6, 7 8 connected
together.
10. This is a momentary withstand test,
not an operating condition.
11. The t
PHL
propagation delay is
measured from the 2.5 V level of the
leading edge of a 5.0 V input pulse (1
μ
s rise time) to the 1.5 V level on the
leading edge of the output pulse (see
Figure 7).
12. The t
PLH
propagation delay is
measured from the 2.5 V level of the
trailing edge of a 5.0 V input pulse (1
μ
s fall time) to the 1.5 V level on the
trailing edge of the output pulse (see
Figure 7).
13. Common mode transient immunity in
Logic High level is the maximum
tolerable dV
CM/dt
of the common mode
voltage, V
CM
, to ensure that the output
will remain in a Logic High state (i.e.,
V
O
> 2.0 V). Common mode transient
immunity in Logic Low level is the
maximum tolerable dV
CM/dt
of the
common mode voltage, V
CM
, to ensure
that the output will remain in a Logic
Low state (i.e., V
O
< 0.8 V). See
Figure 8.
14. In applications where dV
CM/dt
may
exceed 50,000 V/
μ
s (such as static
discharge), a series resistor, R
CC
,
should be included to protect the
detector IC from destructively high
surge currents. The recommended
value for R
CC
is 240
per volt of
allowable drop in V
CC
(between Pin 8
and V
CC
) with a minimum value of
240
.
15. D
1
and D
2
are Schottky diodes; D
3
and D
4
are zener diodes.
16. Standard parts receive 100% testing at
25
°
C (Subgroups 1 and 9). SMD,
Class H and Class K parts receive
100% testing at 25, 125, and -55
°
C
(Subgroups 1 and 9, 2 and 10 ,3 and
11, respectively.)
17. Parameters shall be tested as part of
device initial characterization and after
process changes. Parameters shall be
guaranteed to the limits specified for
all lots not specifically tested.