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參數資料
| 型號： | 5962-3826717QWV |
| 英文描述： | GIGATRUE 550 CAT6 PATCH 1 FT. SNAGLESS, GREEN |
| 中文描述： | 微電路，存儲器，數字，128K的的CMOS × 8位EEPROM，單片硅 |
| 文件頁數： | 35/40頁 |
| 文件大?。?/td> | 316K |
| 代理商： | 5962-3826717QWV |
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STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
SIZE
A
5962-38267
REVISION LEVEL
G
SHEET
35
DSCC FORM 2234
APR 97
4.4.4 Group E inspection. Group E inspection is required only for parts intended to be marked as radiation hardness assured
(see 3.5 herein). RHA levels for device classes M, Q, and V shall be as specified in MIL-PRF-38535.
a.
End-point electrical parameters shall be as specified in table IIA herein.
b.
For device classes Q and V, the devices or test vehicle shall be subjected to radiation hardness assured tests as specified
in MIL-PRF-38535 for the RHA level being tested. For device class M, the devices shall be subjected to radiation
hardness assured tests as specified in MIL-PRF-38535, appendix A for the RHA level being tested. All device classes
must meet the postirradiation end-point electrical parameter limits as defined in table IA at TA
exposure, to the subgroups specified in table IIA herein.
c.
When specified in the purchase order or contract, a copy of the RHA delta limits shall be supplied.
4.5 Methods of inspection. Methods of inspection shall be as specified in the appropriate figures and tables as follows.
4.5.1 Erasing procedures. The erasing procedures shall be as specified by the device manufacturer and shall be available upon
request.
4.5.2 Programming procedure. The programming procedures shall be as specified by the device manufacturer and shall be made
available upon request.
4.5.3 Software data protect procedures. The software data protect procedures shall be as specified by the device manufacturer
and shall be made available upon request.
4.6 Delta measurements for device classes Q and V. Delta measurements, as specified in table IIA, shall be made and recorded
before and after the required burn-in screens and steady-state life tests to determine delta compliance. The electrical parameters
to be measured, with associated delta limits are listed in table IIB. The device manufacturer may, at his option, either perform delta
measurements or within 24 hours after burn-in perform final electrical parameter tests, subgroups 1, 7, and 9.
5. PACKAGING
5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535 for device classes
Q and V or MIL-PRF-38535, appendix A for device class M.
6. NOTES
6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original
equipment), design applications, and logistics purposes.
6.1.1 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-prepared
specification or drawing.
6.1.2 Substitutability. Device class Q devices will replace device class M devices.
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相關代理商/技術參數 |
參數描述 |
|---|---|
| 5962-3826717QXM | 制造商:MAXWELL 制造商全稱:Maxwell Technologies 功能描述:MICROCIRCUIT, MEMORY, DIGITAL, CMOS 128K x 8 BIT EEPROM, MONOLITHIC SILICON |
| 5962-3826717QXQ | 制造商:MAXWELL 制造商全稱:Maxwell Technologies 功能描述:MICROCIRCUIT, MEMORY, DIGITAL, CMOS 128K x 8 BIT EEPROM, MONOLITHIC SILICON |
| 5962-3826717QXV | 制造商:MAXWELL 制造商全稱:Maxwell Technologies 功能描述:MICROCIRCUIT, MEMORY, DIGITAL, CMOS 128K x 8 BIT EEPROM, MONOLITHIC SILICON |
| 5962-3826717QZM | 制造商:MAXWELL 制造商全稱:Maxwell Technologies 功能描述:MICROCIRCUIT, MEMORY, DIGITAL, CMOS 128K x 8 BIT EEPROM, MONOLITHIC SILICON |
| 5962-3826717QZQ | 制造商:MAXWELL 制造商全稱:Maxwell Technologies 功能描述:MICROCIRCUIT, MEMORY, DIGITAL, CMOS 128K x 8 BIT EEPROM, MONOLITHIC SILICON |
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