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參數(shù)資料
| 型號(hào)： | 570FAA000576DG |
| 廠商： | SILICON LABORATORIES |
| 元件分類： | XO, clock |
| 英文描述： | CRYSTAL OSCILLATOR, CLOCK, 10 MHz - 1417.5 MHz, LVDS OUTPUT |
| 封裝： | ROHS COMPLIANT PACKAGE-8 |
| 文件頁(yè)數(shù)： | 4/30頁(yè) |
| 文件大?。?/td> | 361K |
| 代理商： | 570FAA000576DG |
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Si570/Si571
12
Rev. 1.1
Table 11. Environmental Compliance
The Si570/571 meets the following qualification test requirements.
Parameter
Conditions/Test Method
Mechanical Shock
MIL-STD-883F, Method 2002.3 B
Mechanical Vibration
MIL-STD-883F, Method 2007.3 A
Solderability
MIL-STD-883F, Method 203.8
Gross & Fine Leak
MIL-STD-883F, Method 1014.7
Resistance to Solvents
MIL-STD-883F, Method 2016
Table 12. Programming Constraints and Timing
(VDD = 3.3 V ±10%, TA = –40 to 85 C)
Parameter
Symbol
Test Condition
Min
Typ
Max
Unit
Output Frequency Range
CKOF
HS_DIV x N1 > = 6
10
—
945
MHz
HS_DIV x N1 = 5
N1 = 1
970
—
1134
MHz
HS_DIV = 4
N1 = 1
1.2125
—
1.4175
GHz
Frequency Reprogramming
Resolution
MRES
114.285 MHz
—
0.09
—
ppb
Internal Oscillator Frequency
fOSC
4850
—
5670
MHz
Internal Crystal Frequency
Accuracy
fXTAL
Maximum variation is
±2000 ppm
—
114.285
—
MHz
Delta Frequency for Continu-
ous Output
From center frequency
–3500
—
+3500
ppm
Unfreeze to NewFreq Delay
10
ms
Settling time for small
frequency change
<±3500 ppm from
center frequency
——
100
s
Settling time for large
frequency change
>±3500 ppm from
center frequency after
setting NewFreq bit
——
10
ms
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