參數(shù)資料
型號: SN74CBT16233DGG
廠商: Texas Instruments, Inc.
英文描述: 16-BIT 1-OF-2 FET MULTIPLEXER/DEMULTIPLEXER
中文描述: 16位1 - 2場效應復用器/解復用器
文件頁數(shù): 1/5頁
文件大小: 77K
代理商: SN74CBT16233DGG
SN74CBT16233
16-BIT 1-OF-2 FET MULTIPLEXER/DEMULTIPLEXER
SCDS010H – MAY 1995 – REVISED OCTOBER 1998
1
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
5-
Switch Connection Between Two Ports
TTL-Compatible Input Levels
Package Options Include Plastic Thin
Shrink Small-Outline (DGG), Thin Very
Small-Outline (DGV), and 300-mil Shrink
Small-Outline (DL) Packages
description
The SN74CBT16233 is a 16-bit 1-of-2 FET
multiplexer/demultiplexer used in applications in
which two separate data paths must be
multiplexed onto, or demultiplexed from, a single
path. This device can be used for memory
interleaving, where two different banks of memory
need to be addressed simultaneously. The device
can be used as two 8-bit to 16-bit multiplexers or
as one 16-bit to 32-bit multiplexer.
Two select (SEL1 and SEL2) inputs control the
data flow. When the TEST inputs are asserted, the
A port is connected to both the B1 and the B2
ports. SEL1, SEL2, and the TEST inputs can be
driven with a 5-V CMOS, a 5-V TTL, or a
low-voltage TTL driver.
The device is specified by design not to have
through current when switching directions.
The SN74CBT16233 is characterized for
operation from 0
°
C to 70
°
C.
FUNCTION TABLE
(each multiplexer/demultiplexer)
INPUTS
SEL
L
FUNCTION
TEST
L
A = B1
H
L
A = B2
X
H
A = B1 and A = B2
DGG, DGV, OR DL PACKAGE
(TOP VIEW)
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
56
55
54
53
52
51
50
49
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
1A
2B1
2B2
3A
4B1
4B2
5A
6B1
6B2
7A
8B1
8B2
GND
V
CC
9A
10B1
10B2
11A
12B1
12B2
13A
14B1
14B2
15A
16B1
16B2
TEST1
TEST2
1B1
1B2
2A
3B1
3B2
4A
5B1
5B2
6A
7B1
7B2
8A
GND
V
CC
9B1
9B2
10A
11B1
11B2
12A
13B1
13B2
14A
15B1
15B2
16A
SEL1
SEL2
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
Copyright
1998, Texas Instruments Incorporated
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
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