參數(shù)資料
型號(hào): SN74ABT8952DLR
廠商: Texas Instruments, Inc.
英文描述: SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS
中文描述: 掃描測(cè)試設(shè)備與八進(jìn)制注冊(cè)總線收發(fā)器
文件頁數(shù): 21/29頁
文件大?。?/td> 509K
代理商: SN74ABT8952DLR
SN54ABT8952, SN74ABT8952
SCAN TEST DEVICES WITH
OCTAL REGISTERED BUS TRANSCEIVERS
SCBS121D – AUGUST 1992 – REVISED JULY 1996
21
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
timing requirements over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (normal mode) (see Figure 13)
SN54ABT8952
MIN
SN74ABT8952
MIN
UNIT
MAX
MAX
fclock
tw
Clock frequency
CLKAB or CLKBA
0
100
0
100
MHz
Pulse duration
CLKAB or CLKBA high or low
A before CLKAB
or B before CLKBA
CLKEN before CLK
A after CLKAB
or B after CLKBA
CLKEN after CLK
3
3
ns
tsu
Setup time
4.5
4.5
ns
4.5
4.5
th
Hold time
0
0
ns
0
0
timing requirements over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (test mode) (see Figure 13)
SN54ABT8952
SN74ABT8952
UNIT
MIN
MAX
MIN
MAX
fclock
tw
Clock frequency
TCK
0
50
0
50
MHz
Pulse duration
TCK high or low
A, B, CLK, CLKEN, or OE before TCK
TDI before TCK
TMS before TCK
A, B, CLK, CLKEN, or OE after TCK
TDI after TCK
TMS after TCK
Power up to TCK
VCC power up
5
5
ns
5
5
tsu
Setup time
6
6
ns
6
6
0
0
th
Hold time
0
0
ns
0
0
td
tr
Delay time
50*
50
ns
μ
s
Rise time
1*
1
*On products compliant to MIL-PRF-38535, this parameter is not production tested.
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
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