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參數資料
| 型號： | SN74ABT8952DLR |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS |
| 中文描述： | 掃描測試設備與八進制注冊總線收發(fā)器 |
| 文件頁數： | 1/29頁 |
| 文件大?。?/td> | 509K |
| 代理商： | SN74ABT8952DLR |
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SN54ABT8952, SN74ABT8952
SCAN TEST DEVICES WITH
OCTAL REGISTERED BUS TRANSCEIVERS
SCBS121D – AUGUST 1992 – REVISED JULY 1996
1
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Members of the Texas Instruments
SCOPE
Family of Testability Products
Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port and
Boundary-Scan Architecture
Functionally Equivalent to ’BCT2952 and
’ABT2952 in the Normal-Function Mode
SCOPE
Instruction Set
IEEE Standard 1149.1-1990 Required
Instructions, Optional INTEST, CLAMP, and
HIGHZ
Parallel-Signature Analysis at Inputs With
Masking Option
Pseudo-Random Pattern Generation From
Outputs
Sample Inputs/Toggle Outputs
Binary Count From Outputs
Even-Parity Opcodes
Two Boundary-Scan Cells Per I/O for
Greater Flexibility
State-of-the-Art EPIC-
ΙΙ
B
BiCMOS Design
Significantly Reduces Power Dissipation
Package Options Include Shrink
Small-Outline (DL) and Plastic
Small-Outline (DW) Packages, Ceramic
Chip Carriers (FK), and Standard Ceramic
DIPs (JT)
description
The ’ABT8952 scan test devices with octal
registered bus transceivers are members of the
Texas Instruments SCOPE
testability integra-
ted-circuit family. This family of devices supports
IEEE Standard 1149.1-1990 boundary scan to
facilitate testing of complex circuit-board assem-
blies. Scan access to the test circuitry is
accomplished via the 4-wire test access port
(TAP) interface.
In the normal mode, these devices are functionally equivalent to the ’BCT2952 and ’ABT2952 octal registered
bus transceivers. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing
at the device pins or to perform a self-test on the boundary-test cells. Activating the TAP in normal mode does
not affect the functional operation of the SCOPE
octal registered bus transceivers.
Copyright
1996, Texas Instruments Incorporated
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
UNLESS OTHERWISE NOTED this document contains PRODUCTION
specifications per the terms of Texas Instruments standard warranty.
Production processing does not necessarily include testing of all
parameters.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
SCOPE and EPIC-
ΙΙ
B are trademarks of Texas Instruments Incorporated.
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CLKAB
CLKENAB
OEAB
A1
A2
A3
GND
A4
A5
A6
A7
A8
TDO
TMS
CLKBA
CLKENBA
OEBA
B1
B2
B3
B4
V
CC
B5
B6
B7
B8
TDI
TCK
3 2 1
13 14
5
6
7
8
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B7
B8
TDI
TCK
TMS
TDO
A8
OEBA
CLKENBA
CLKBA
CLKAB
CLKENAB
OEAB
A1
4
15 16 17 18
A
G
A
A
A
A
B
B
B
B
28 27 2625
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12
A
V
B
B
C
SN54ABT8952 . . . JT PACKAGE
SN74ABT8952 . . . DL OR DW PACKAGE
(TOP VIEW)
SN54ABT8952 . . . FK PACKAGE
(TOP VIEW)
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相關代理商/技術參數 |
參數描述 |
|---|---|
| SN74ABT8952DLRG4 | 功能描述:特定功能邏輯 Device w/Octal Rgstr Bus Transceiver RoHS:否 制造商:Texas Instruments 產品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SN74ABT8952DW | 功能描述:特定功能邏輯 Device w/Octal Rgstr Bus Transceiver RoHS:否 制造商:Texas Instruments 產品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SN74ABT8952DWE4 | 功能描述:特定功能邏輯 Device w/Octal Rgstr Bus Transceiver RoHS:否 制造商:Texas Instruments 產品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SN74ABT8952DWG4 | 功能描述:特定功能邏輯 Scan Test Devices RoHS:否 制造商:Texas Instruments 產品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SN74ABT8952DWR | 功能描述:特定功能邏輯 Device w/Octal Rgstr Bus Transceiver RoHS:否 制造商:Texas Instruments 產品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
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