參數(shù)資料
型號(hào): SN74ABT8646DWR
廠商: Texas Instruments, Inc.
英文描述: SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND RESISTERS
中文描述: 掃描測(cè)試設(shè)備與八路總線收發(fā)器和電阻
文件頁(yè)數(shù): 5/32頁(yè)
文件大小: 532K
代理商: SN74ABT8646DWR
SCBS123F AUGUST 1992 REVISED APRIL 2004
5
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Terminal Functions
TERMINAL
NAME
DESCRIPTION
A1A8
Normal-function A-bus I/O ports. See function table for normal-mode logic.
B1B8
Normal-function B-bus I/O ports. See function table for normal-mode logic.
CLKAB, CLKBA
Normal-function clock inputs. See function table for normal-mode logic.
DIR
Normal-function direction-control input. See function table for normal-mode logic.
GND
Ground
OE
Normal-function output-enable input. See function table for normal-mode logic.
SAB, SBA
Normal-function select inputs. See function table for normal-mode logic.
TCK
Test clock. One of four terminals required by IEEE Standard 1149.1-1990. Test operations of the device are synchronous
to TCK. Data is captured on the rising edge of TCK, and outputs change on the falling edge of TCK.
TDI
Test data input. One of four terminals required by IEEE Standard 1149.1-1990. TDI is the serial input for shifting data
through the instruction register or selected data register. An internal pullup forces TDI to a high level if left unconnected.
TDO
Test data output. One of four terminals required by IEEE Standard 1149.1-1990. TDO is the serial output for shifting data
through the instruction register or selected data register.
TMS
Test mode select. One of four terminals required by IEEE Standard 1149.1-1990. TMS input directs the device through
its TAP controller states. An internal pullup forces TMS to a high level if left unconnected.
VCC
Supply voltage
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