參數(shù)資料
型號(hào)： SN74ABT8646DWR
廠商： Texas Instruments, Inc.
英文描述： SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND RESISTERS
中文描述： 掃描測(cè)試設(shè)備與八路總線收發(fā)器和電阻
文件頁(yè)數(shù)： 2/32頁(yè)
文件大?。?/td> 532K
代理商： SN74ABT8646DWR
SCBS123F AUGUST 1992 REVISED APRIL 2004
2
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
description (continued)
Transceiver function is controlled by output-enable (OE) and direction (DIR) inputs. When OE is low, the
transceiver is active and operates in the A-to-B direction when DIR is high or in the B-to-A direction when DIR
is low. When OE is high, both the A and B outputs are in the high-impedance state, effectively isolating both
buses.
Data flow is controlled by clock (CLKAB and CLKBA) and select (SAB and SBA) inputs. Data on the A bus is
clocked into the associated registers on the low-to-high transition of CLKAB. When SAB is low, real-time A data
is selected for presentation to the B bus (transparent mode). When SAB is high, stored A data is selected for
presentation to the B bus (registered mode). The function of the CLKBA and SBA inputs mirrors that of CLKAB
and SAB, respectively. Figure 1 shows the four fundamental bus-management functions that can be performed
with the ’ABT8646.
In the test mode, the normal operation of the SCOPE
bus transceivers and registers is inhibited, and the test
circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry
performs boundary-scan test operations as described in IEEE Standard 1149.1-1990.
Four dedicated test pins control the operation of the test circuitry: test data input (TDI), test data output (TDO),
test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing functions
such as parallel-signature analysis (PSA) on data inputs and pseudorandom pattern generation (PRPG) from
data outputs. All testing and scan operations are synchronized to the TAP interface.
The SN54ABT8646 is characterized for operation over the full military temperature range of 55
°
C to 125
°
C.
The SN74ABT8646 is characterized for operation from 40
°
C to 85
°
C.
FUNCTION TABLE
INPUTS
DATA I/O
OPERATION OR FUNCTION
OE
DIR
CLKAB
↑
X
↑
H or L
CLKBA
SAB
SBA
A1A8
B1B8
Unspecified
X
X
X
↑
↑
X
X
Input
Store A, B unspecified
Store B, A unspecified
X
X
X
X
Unspecified
Input
H
X
X
X
Input
Input
Store A and B data
H
X
H or L
X
X
Input disabled
Input disabled
Isolation, hold storage
L
L
X
X
X
L
Output
Input
Real-time B data to A bus
L
L
X
H or L
X
H
Output
Input disabled
Stored B data to A bus
L
H
X
X
L
X
Input
Output
Real-time A data to B bus
L
H
H or L
X
H
X
Input disabled
Output
Stored A data to B bus
The data-output functions can be enabled or disabled by various signals at OE and DIR. Data-input functions are always enabled; i.e., data at
the bus pins is stored on every low-to-high transition of the clock inputs.
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相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
SN74ABT8646DWRE4 功能描述:特定功能邏輯 Device w/Octal Bus Trnscvr & Register RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74ABT8646DWRG4 功能描述:特定功能邏輯 Scan Test Devices RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74ABT8652DL 功能描述:特定功能邏輯 Device w/Octal Bus Trnscvr & Register RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74ABT8652DLG4 功能描述:特定功能邏輯 Device w/Octal Bus Trnscvr & Register RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74ABT8652DLR 功能描述:特定功能邏輯 Device w/Octal Bus Trnscvr & Register RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
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