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參數(shù)資料
| 型號(hào)： | SN54ABT8952 |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS |
| 中文描述： | 掃描測(cè)試設(shè)備與八進(jìn)制注冊(cè)總線收發(fā)器 |
| 文件頁(yè)數(shù)： | 21/24頁(yè) |
| 文件大小： | 365K |
| 代理商： | SN54ABT8952 |
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SN54ABT8952, SN74ABT8952
SCAN TEST DEVICES WITH
OCTAL REGISTERED BUS TRANSCEIVERS
SCBS121D – AUGUST 1992 – REVISED JULY 1996
21
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
timing requirements over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (normal mode) (see Figure 13)
SN54ABT8952
MIN
SN74ABT8952
MIN
UNIT
MAX
MAX
fclock
tw
Clock frequency
CLKAB or CLKBA
0
100
0
100
MHz
Pulse duration
CLKAB or CLKBA high or low
A before CLKAB
↑
or B before CLKBA
↑
CLKEN before CLK
↑
A after CLKAB
↑
or B after CLKBA
↑
CLKEN after CLK
↑
3
3
ns
tsu
Setup time
4.5
4.5
ns
4.5
4.5
th
Hold time
0
0
ns
0
0
timing requirements over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (test mode) (see Figure 13)
SN54ABT8952
SN74ABT8952
UNIT
MIN
MAX
MIN
MAX
fclock
tw
Clock frequency
TCK
0
50
0
50
MHz
Pulse duration
TCK high or low
A, B, CLK, CLKEN, or OE before TCK
↑
TDI before TCK
↑
TMS before TCK
↑
A, B, CLK, CLKEN, or OE after TCK
↑
TDI after TCK
↑
TMS after TCK
↑
Power up to TCK
↑
VCC power up
5
5
ns
5
5
tsu
Setup time
6
6
ns
6
6
0
0
th
Hold time
0
0
ns
0
0
td
tr
Delay time
50*
50
ns
μ
s
Rise time
1*
1
*On products compliant to MIL-PRF-38535, this parameter is not production tested.
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
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