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參數(shù)資料
| 型號： | SN54ABT8652JT |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS |
| 中文描述： | 掃描測試設備與八路總線收發(fā)器和寄存器 |
| 文件頁數(shù)： | 16/25頁 |
| 文件大?。?/td> | 366K |
| 代理商： | SN54ABT8652JT |
SN54ABT8652, SN74ABT8652
SCAN TEST DEVICES
WITH OCTAL BUS TRANSCEIVERS AND REGISTERS
SCBS122F – AUGUST 1992 – REVISED DECEMBER 1996
16
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
simultaneous PSA and PRPG (PSA/PRPG)
Data appearing at the selected device input terminals is compressed into an 8-bit parallel signature in the
shift-register elements of the selected input BSCs on each rising edge of TCK. This data is updated in the
shadow latches of the selected input BSCs and applied to the inputs of the normal on-chip logic. At the same
time, an 8-bit pseudo-random pattern is generated in the shift-register elements of the selected output BSCs
on each rising edge of TCK, updated in the shadow latches, and applied to the associated device output
terminals on each falling edge of TCK. Figures 9 and 10 show the 8-bit linear-feedback shift-register algorithms
through which the signature and patterns are generated. An initial seed value should be scanned into the BSR
before performing this operation. A seed value of all zeroes does not produce additional patterns.
=
=
M
A8-I
B8-O
A7-I
A6-I
A5-I
A4-I
A3-I
A2-I
A1-I
B7-O
B6-O
B5-O
B4-O
B3-O
B2-O
B1-O
Figure 9. 8-Bit PSA/PRPG Configuration (OEAB = 1, OEBA = 1)
=
=
M
B8-I
A8-O
B7-I
B6-I
B5-I
B4-I
B3-I
B2-I
B1-I
A7-O
A6-O
A5-O
A4-O
A3-O
A2-O
A1-O
Figure 10. 8-Bit PSA/PRPG Configuration (OEAB = 0, OEBA = 0)
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