參數(shù)資料
型號(hào)： SN54ABT8652FK
廠商： Texas Instruments, Inc.
英文描述： SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS
中文描述： 掃描測(cè)試設(shè)備與八路總線收發(fā)器和寄存器
文件頁(yè)數(shù)： 5/25頁(yè)
文件大?。?/td> 366K
代理商： SN54ABT8652FK
SN54ABT8652, SN74ABT8652
SCAN TEST DEVICES
WITH OCTAL BUS TRANSCEIVERS AND REGISTERS
SCBS122F – AUGUST 1992 – REVISED DECEMBER 1996
5
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Terminal Functions
TERMINAL
NAME
DESCRIPTION
A1–A8
Normal-function A-bus I/O ports. See function table for normal-mode logic.
B1–B8
Normal-function B-bus I/O ports. See function table for normal-mode logic.
CLKAB, CLKBA
Normal-function clock inputs. See function table for normal-mode logic.
GND
Ground
OEAB, OEBA
Normal-function output-enable inputs. See function table for normal-mode logic.
SAB, SBA
Normal-function select inputs. See function table for normal-mode logic.
TCK
Test clock. One of four terminals required by IEEE Standard 1149.1-1990. Test operations of the device are synchronous
to TCK. Data is captured on the rising edge of TCK, and outputs change on the falling edge of TCK.
TDI
Test data input. One of four terminals required by IEEE Standard 1149.1-1990. TDI is the serial input for shifting data
through the instruction register or selected data register. An internal pullup forces TDI to a high level if left unconnected.
TDO
Test data output. One of four terminals required by IEEE Standard 1149.1-1990. TDO is the serial output for shifting data
through the instruction register or selected data register.
TMS
Test mode select. One of four terminals required by IEEE Standard 1149.1-1990. TMS directs the device through its TAP
controller states. An internal pullup forces TMS to a high level if left unconnected.
VCC
Supply voltage
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