- 您現(xiàn)在的位置：買賣IC網(wǎng) > PDF目錄374848 > SN54ABT8652FK (Texas Instruments, Inc.) SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS PDF資料下載
參數(shù)資料
| 型號(hào)： | SN54ABT8652FK |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS |
| 中文描述： | 掃描測(cè)試設(shè)備與八路總線收發(fā)器和寄存器 |
| 文件頁(yè)數(shù)： | 24/25頁(yè) |
| 文件大?。?/td> | 366K |
| 代理商： | SN54ABT8652FK |
第1頁(yè)第2頁(yè)第3頁(yè)第4頁(yè)第5頁(yè)第6頁(yè)第7頁(yè)第8頁(yè)第9頁(yè)第10頁(yè)第11頁(yè)第12頁(yè)第13頁(yè)第14頁(yè)第15頁(yè)第16頁(yè)第17頁(yè)第18頁(yè)第19頁(yè)第20頁(yè)第21頁(yè)第22頁(yè)第23頁(yè)當(dāng)前第24頁(yè)第25頁(yè)
SN54ABT8652, SN74ABT8652
SCAN TEST DEVICES
WITH OCTAL BUS TRANSCEIVERS AND REGISTERS
SCBS122F – AUGUST 1992 – REVISED DECEMBER 1996
24
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
PARAMETER MEASUREMENT INFORMATION
1.5 V
th
tsu
From Output
Under Test
CL = 50 pF
(see Note A)
LOAD CIRCUIT
S1
7 V
Open
GND
500
500
Data Input
Timing Input
1.5 V
3 V
0 V
1.5 V
1.5 V
3 V
0 V
3 V
0 V
1.5 V
1.5 V
tw
Input
VOLTAGE WAVEFORMS
SETUP AND HOLD TIMES
VOLTAGE WAVEFORMS
PROPAGATION DELAY TIMES
INVERTING AND NONINVERTING OUTPUTS
VOLTAGE WAVEFORMS
PULSE DURATION
tPLH
tPHL
tPHL
tPLH
VOH
VOH
VOL
VOL
1.5 V
1.5 V
3 V
0 V
1.5 V
1.5 V
Input
1.5 V
Output
Control
Output
Waveform 1
S1 at 7 V
(see Note B)
Output
Waveform 2
S1 at Open
(see Note B)
VOL
VOH
tPZL
tPZH
tPLZ
tPHZ
1.5 V
1.5 V
3.5 V
0 V
1.5 V
VOL + 0.3 V
1.5 V
VOH – 0.3 V
0 V
3 V
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
LOW- AND HIGH-LEVEL ENABLING
Output
Output
tPLH/tPHL
tPLZ/tPZL
tPHZ/tPZH
Open
7 V
Open
TEST
S1
NOTES: A. CL includes probe and jig capacitance.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR
≤
10 MHz, ZO = 50
, tr
≤
2.5 ns, tf
≤
2.5 ns.
D. The outputs are measured one at a time with one transition per measurement.
Figure 14. Load Circuit and Voltage Waveforms
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| SN54ABT8652JT | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS |
| SN54ABT8952 | SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS |
| SN54ABT8952FK | SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS |
| SN54ABT8952JT | SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS |
| SN54ABTE16245WD | 16-BIT INCIDENT-WAVE SWITCHING BUS TRANSCEIVERS WITH 3-STATE OUTPUTS |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| SN54ABT8652JT | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS |
| SN54ABT8952 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS |
| SN54ABT8952_07 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS |
| SN54ABT8952FK | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS |
| SN54ABT8952JT | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS |
發(fā)布緊急采購(gòu)，3分鐘左右您將得到回復(fù)。