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參數資料
| 型號： | SN54ABT8652FK |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS |
| 中文描述： | 掃描測試設備與八路總線收發(fā)器和寄存器 |
| 文件頁數： | 20/25頁 |
| 文件大?。?/td> | 366K |
| 代理商： | SN54ABT8652FK |
SN54ABT8652, SN74ABT8652
SCAN TEST DEVICES
WITH OCTAL BUS TRANSCEIVERS AND REGISTERS
SCBS122F – AUGUST 1992 – REVISED DECEMBER 1996
20
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
TA = 25
°
C
TYP
SN54ABT8652
MIN
SN74ABT8652
MIN
UNIT
MIN
MAX
MAX
MAX
VIK
VCC = 4.5 V,
VCC = 4.5 V,
VCC = 5 V,
II = –18 mA
IOH = –3 mA
IOH = –3 mA
IOH = –24 mA
IOH = –32 mA
IOL = 48 mA
IOL = 64 mA
–1.2
–1.2
–1.2
V
2.5
2.5
2.5
VOH
3
3
3
V
VCC= 4 5 V
VCC = 4.5 V
2
2
2*
2
VOL
VCC= 4 5 V
VCC = 4.5 V
0.55
0.55
V
0.55*
0.55
II
CLK, OEAB,
OEBA, S, TCK
VCC = 5.5 V, VI = VCC or GND
±
1
±
1
±
1
A
μ
A or B ports
±
100
10
±
100
10
±
100
10
IIH
IIL
IOZH
IOZL
IOZPU
IOZPD
Ioff
ICEX
IO§
TDI, TMS
VCC = 5.5 V,
VCC = 5.5 V,
VCC = 5.5 V,
VCC = 5.5 V,
VCC = 0 to 2 V, VO = 0.5 V or 2.7 V
VCC = 2 V to 0, VO = 0.5 V or 2.7 V
VCC = 0,
VCC = 5.5 V,
VCC = 5.5 V,
VI = VCC
VI = GND
VO = 2.7 V
VO = 0.5 V
μ
A
μ
A
μ
A
μ
A
μ
A
μ
A
μ
A
μ
A
mA
TDI, TMS
–40
–160
–40
–160
–40
–160
50
50
50
–50
±
50
±
50
±
100
50
–50
±
50
±
50
–50
±
50
±
50
±
100
50
VI or VO
≤
4.5 V
VO = 5.5 V
VO = 2.5 V
Outputs high
Outputs high
50
–50
–100
–180
–50
–180
–50
–180
VCC= 5.5 V,
VCC = 5.5 V,
IO = 0,
VI = VCC or GND
0.9
2
2
2
ICC
A or B ports
Outputs low
30
38
38
38
mA
Outputs disabled
0.9
2
2
2
ICC
VCC = 5.5 V, One input at 3.4 V,
Other inputs at VCC or GND
VI = 2.5 V or 0.5 V
VO = 2.5 V or 0.5 V
VO = 2.5 V or 0.5 V
1.5
1.5
1.5
mA
Ci
Cio
Co
Control inputs
3
pF
A or B ports
10
pF
TDO
8
pF
* On products compliant to MIL-PRF-38535, this parameter does not apply.
All typical values are at VCC = 5 V.
The parameters IOZH and IOZL include the input leakage current.
§Not more than one output should be tested at a time, and the duration of the test should not exceed one second.
This is the increase in supply current for each input that is at the specified TTL voltage level rather than VCC or GND.
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