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參數(shù)資料
| 型號： | SN54ABT8245FK |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS |
| 中文描述： | 掃描測試設備與八進制總線收發(fā)器 |
| 文件頁數(shù)： | 19/25頁 |
| 文件大小： | 364K |
| 代理商： | SN54ABT8245FK |
SN54ABT8245, SN74ABT8245
SCAN TEST DEVICES
WITH OCTAL BUS TRANSCEIVERS
SCBS124D – AUGUST 1992 – REVISED DECEMBER 1996
19
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
E
E
T
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
R
S
S
C
S
U
S
C
S
U
S
S
T
TCK
TMS
TDI
TDO
TAP
Controller
State
3-State (TDO) or Don’t Care (TDI)
Figure 12. Timing Example
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, V
CC
Input voltage range, V
I
(except I/O ports) (see Note 1)
Input voltage range, V
I
(I/O ports) (see Note 1)
Voltage range applied to any output in the high state or power-off state, V
O
Current into any output in the low state, I
O
: SN54ABT8245
–0.5 V to 7 V
–0.5 V to 7 V
–0.5 V to 5.5 V
–0.5 V to 5.5 V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
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. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . .
96 mA
128 mA
–18 mA
–50 mA
1.7 W
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
SN74ABT8245
Input clamp current, I
IK
(V
I
< 0)
Output clamp current, I
OK
(V
O
< 0)
Maximum power dissipation at T
A
= 55
°
C (in still air) (see Note 2): DW package
Storage temperature range, T
stg
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES:
1. The input and output negative-voltage ratings can be exceeded if the input and output clamp-current ratings are observed.
2. The maximum package power dissipation is calculated using a junction temperature of 150
°
C and a board trace length of 750 mils.
For more information, refer to the Package Thermal Considerationsapplication note in the ABT Advanced BiCMOS Technology Data
Book literature number SCBD002.
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. . . . . . . . . . . . . . . . .
–65
°
C to 150
°
C
相關PDF資料 |
PDF描述 |
|---|---|
| SN54ABT8245JT | SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS |
| SN54ABT827FK | 10-BIT BUFFERS/DRIVERS WITH 3-STATE OUTPUTS |
| SN54ABT827JT | 10-BIT BUFFERS/DRIVERS WITH 3-STATE OUTPUTS |
| SN74ABT827DB | 10-BIT BUFFERS/DRIVERS WITH 3-STATE OUTPUTS |
| SN54ABT833 | 8-BIT TO 9-BIT PARITY BUS TRANSCEIVERS |
相關代理商/技術參數(shù) |
參數(shù)描述 |
|---|---|
| SN54ABT8245JT | 制造商:TI 制造商全稱:Texas Instruments 功能描述:SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS |
| SN54ABT827 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:10-BIT BUFFERS/DRIVERS WITH 3-STATE OUTPUTS |
| SN54ABT827FK | 制造商:TI 制造商全稱:Texas Instruments 功能描述:10-BIT BUFFERS/DRIVERS WITH 3-STATE OUTPUTS |
| SN54ABT827JT | 制造商:TI 制造商全稱:Texas Instruments 功能描述:10-BIT BUFFERS/DRIVERS WITH 3-STATE OUTPUTS |
| SN54ABT833 | 制造商:TI 制造商全稱:Texas Instruments 功能描述:8-BIT TO 9-BIT PARITY BUS TRANSCEIVERS |
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