參數(shù)資料
型號: CGS702V
廠商: NATIONAL SEMICONDUCTOR CORP
元件分類: 時(shí)鐘及定時(shí)
英文描述: Commercial Low Skew PLL 1 to 9 CMOS Clock Driver with Improved EMI
中文描述: 702 SERIES, PLL BASED CLOCK DRIVER, 9 TRUE OUTPUT(S), 0 INVERTED OUTPUT(S), PQCC28
封裝: PLASTIC, LCC-28
文件頁數(shù): 7/10頁
文件大?。?/td> 181K
代理商: CGS702V
EMI Characteristics and Measurements for CGS702
MEASURING THE SPECTRAL CONTENT OF A LOGIC IC
In order to analyze the frequency, or spectral content of
logic ICs, two measurement techniques have been devel-
oped. One method, The Radiated Measurement Method, is
based on the system-level FCC certification test methodolo-
gy, FCC Open Site Test (OST) 55. The radiated method
utilizes a multilayer PCB with the IC-under-test is mounted
on a grounded, adjustable table placed 3 meters from an
antenna mast (seeFigure 3). The IC’s input is stimulated by
a known periodic waveform and its output drives a typical
PCB microstrip. The 75
X
microstrip is properly terminated
to prevent reflections from affecting the IC’s spectral con-
tent results.
The FCC certification test method is anopen field measure-
ment procedure. Therefore, the spectral content of the de-
vice-under-test (in this case, an IC) cannot be detected be-
low the ambient level of radiation. The test-site is perma-
nent and the average ambient noise level remains relatively
constant.
The CGS700 and CGS702 were tested for EMI using the
above method. A comparison of the EMI results in the form
of spectral content is shown in Figures 4 and 5.
For more details on EMI, see Application Note AN-831.
Screen Room with 120 dB Shielding
TL/F/12386–9
FIGURE 3. Radiated EMI Measurement Method
7
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