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參數(shù)資料
| 型號(hào)： | ALD-FREQ-L-H-C-A-T |
| 廠商： | ABRACON CORP |
| 元件分類： | XO, clock |
| 英文描述： | CRYSTAL OSCILLATOR, CLOCK, 0.75 MHz - 800 MHz, CMOS OUTPUT |
| 封裝： | ROHS COMPLIANT, LOW PROFILE, CERAMIC, SMD, 6 PIN |
| 文件頁(yè)數(shù)： | 1/3頁(yè) |
| 文件大?。?/td> | 1868K |
| 代理商： | ALD-FREQ-L-H-C-A-T |
| | | | | | | | | | | | | | |
ALD SERIES
STANDARD SPECIFICATIONS:
APPLICATIONS:
SONET, xDSL
SDH, CPE
STB
FEATURES:
Based on a proprietary digital multiplier
Tri-State Output
Low Phase Noise and Jitter
156.25MHz, 187.5MHz, and 212.5MHz applications
2.5V to 3.3V +/- 5% operation
Ceramic SMD, low profile package
PARAMETERS
5.0 x 7.0 x 1.8mm
Pb RoHS
Compliant
ABRACON IS
ISO 9001 / QS 9000
CERTIFIED
ABRACON IS
ISO 9001 / QS 9000
CERTIFIED
30332 Esperanza, Rancho Santa Margarita, California 92688
tel 949-546-8000 | fax 949-546-8001 | www.abracon.com
Revised: 08.18.09
Visit www.abracon.com for Terms & Conditions of Sale
CRYSTAL CLOCK OSCILLATOR
PECL/LVDS/CMOS OUTPUT SMD
ABRACON P/N:
ALD Series
Frequency range:
750 kHz to 800 MHz
Operating temperature:
0° C to + 70° C (see options)
Storage temperature:
- 55° C to + 125° C
Overall frequency stability:
± 50 ppm max. (see options)
Supply voltage (Vdd):
3.3V ±10% (see options)
Jitter (12KHz - 20MHz) =
RMS phase jitter 3ps typ., <5ps max.
period jitter < 35 ps peak to peak typical.
Low Phase Noise:
-109 dBc/Hz @ 1kHz Offset from 622.08MHz
-110 dBc/Hz @ 10kHz Offset from 622.08MHz
-109 dBc/Hz @ 100KHz Offset from 622.08MHz
-112 dBc/Hz @ 1kHz Offset from 155.52MHz
-125 dBc/Hz @ 10kHz Offset from 155.52MHz
-123 dBc/Hz @ 100KHz Offset from 155.52MHz
Tristate Function:
PECL:
Supply current (IDD):25mA max (for Fo<24MHz),65mA max (for 24MHz<Fo<96MHz) 100mA max (96MHz<Fo<700MHz)
Output Logic High:
Vdd-1.025V min, Vdd-0.880V max.
Output Logic Low:
Vdd-1.810V min. Vdd-1.620V max.
Symmetry (Duty Cycle):
45% min, 50% typ, 55% max,
Rise time:
0.85ns
Fall time:
0.85ns
LVDS
CMOS:
"1" (VIH ≥≥ 0.7*Vdd) or open: Oscillation
"0" (VIL < 0.3*Vdd): No Oscillation / Hi Z
Supply current (IDD):15mA max (for Fo<24MHz),30mA max (for 24MHz<Fo<96MHz),40mA max (96MHz<Fo<700MHz)
Output Clock Rise/ Fall Time [10%~90% VDD with 10pF load]:
1.2ns typ, 1.6ns max.
Output Clock Duty Cycle [Measured @ 50% VDD]:
45% min, 50% typical, 55% max
Supply current (IDD):25mA max (for Fo<24MHz),45mA max (for 24MHz<Fo<96MHz),100mA max (96MHz<Fo<700MHz)
Output Clock Duty Cycle @ 1.25V:
45% min, 50% typical, 55% max
Output Differential Voltage (VOD): 247mV min, 355mV typical, 454mV max
VDD Magnitude Change (VOD): -50mV min, 50mV max
Output High Voltage :
VOH = 1.4V typical, 1.6V max.
Output Low Voltage:
VOL = 0.9V min, 1.1V typical
Offset Voltage [RL = 100]: VOS = 1.125V min, 1.2V typical, 1.375V max
Offset Magnitude Change [RL = 100]: VOS = 0mV min, 3mV typical, 25mV max
Power-off Leakage (IOXD) [Vout=VDD or GND, VDD=0V] = ±1A typical, ±10A max.
Differential Clock Rise Time (tr) [RL=100, CL=10pF]: 0.2nS min, 0.7nS typical, 1.0nS,max
Differential Clock Fall Time (tf) [RL=100, CL=10pF]: 0.2nS min, 0.7nS typical, 1.0nS max
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